Aeroflex introduces the SMART^E 5300 which is a high performance, low life cycle cost, turnkey synthetic test environment for general purpose RF/microwave parametric and functional testing. The DC to 40 GHz SMART^E 5300 is unique in its ability to test, monitor, and control any Device Under Test (DUT) within a single test environment.

SMART^E 5300 eliminates a large rack of test equipment and replaces it with a compact test system that is quickly reconfigured and redeployed to suit any individual DUT or production line. The SMART^E 5300 also has the ability to emulate legacy and obsolete instruments.

The SMART^E 5300 is designed for parametric and functional testing in the military/aerospace and high-performance commercial markets. The system is ideal for customers with one or more of these demanding RF/microwave test requirements:

• High throughput production;
• Large number of unique tests per DUT;
• Highly repetitive tests per DUT;
• Product lines requiring rapid software reconfiguration of test systems;
• Replacement of racks of older or obsolete equipment with a “synthetic” or software-defined test environment.

    
The SMART^E 5300’s many features reduce complexity and result in extending the life cycle of test environments.

• With open system architecture and a highly intuitive user interface, customers can easily write and program new tests and test sequences.
• Third-party modules and instruments are added easily, while system-level software allows easy integration.
• Complete software measurement libraries allow quick set-up for turnkey functional and parametric testing.
• System-level calibration ensures that all modules and instruments are fully integrated and perform highly accurate, coherent and repetitive, NIST traceable measurements right up to the interface of the DUT.
• Diagnostic software allows local and remote troubleshooting to the module or instrument level.
• All hardware modules and interfaces are based on widely used industry standards including PXI, LXI, cPCI, Ethernet, etc. Standard software interfaces are exercised through a full-featured Test Executive and National Instruments’ TestStand engine.

Contact Person : James E. De Broeck