Yokogawa Electric Corporation launches new AQ6373 Optical Spectrum Analyser, which is designed to analyse the wavelength characteristics of light. The AQ6373 is capable of measuring wavelengths ranging from 350 nm to 1200 nm. It is both equipped with a diffraction grating and can cover the entire visible light spectrum (between 380 nm and 780 nm). With its high optical spectrum sensitivity and wide close-in dynamic range, it is suitable for measuring both laser and LED light.
The AQ6373 can accelerate the development and manufacturing of short wavelength lasers, passive devices and LEDs as well as equipment that uses these devices for the biomedical, material processing, consumer product and telecommunications markets.
The new Optical Spectrum Analyser AQ6373 has a high wavelength resolution of up to 0.02 nm and a wide close-in dynamic range. Furthermore, it has a minimum optical spectrum sensitivity of -80 dBm, which is one hundred millionth the intensity of a 1 mW lightwave. This gives it a high signal-to-noise ratio (SNR) in measurements of spontaneous emissions from semiconductor lasers.
The new AQ6373 meets the market’s requirements for a single optical spectrum analyser that can cover the entire visible light spectrum and efficiently perform measurements over a wide wavelength range.
Yokogawa’s proprietary technology makes possible measurement times of 1 second or less over a 100 nm wavelength range. Furthermore, the AQ6373 comes with automatic optical axis alignment and wavelength calibration functions that make this instrument easy to maintain.
Applications: Measurement of the light emission spectrum of lasers and LEDs & Measurement of wavelength transmission and loss characteristics of optical filters and other types of passive components
Key points:- Wavelength range: 350 to 1200nm
- Wavelength accuracy: ±0.05 nm
- Wavelength resolution: 0.02 to 10 nm and 0.01nm (400 to 470nm)
- Max safe input power: +20 dBm
- Level sensitivity: -80 dBm
- Single-mode, Multimode, and Large-core fibers
- Wavelength calibration with an external reference source.
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